Mekmin mind LNX-7530-GL

LNX-7530-GL supports X-axis resolution of 11 um, Z-axis repeat precision of 0.2 um, and F.S. linearity of ± 0.02%. Advanced optical design and AI algorithms can generate 3,200 data points per profile to inspect features of very fine areas such as dents, gaps, and edges.High resolution, high speed scan speed, 0.2 μm repeat precision, single-shot HDR lithium battery cell upper cover welding inspection 0.2 μm Z-axis repeat precision enables high precision and high speed imaging of fine welds.Pin height measurements Advanced optical design and algorithms can generate high-resolution 3D data (3,200 data points per profile) for each pin with high reflectivity from various types of distractions such as blind spots and spikes.It detects various external defects such as the presence or absence of battery terminal quality inspection terminals, welding, and overlap, while accurately measuring the terminal height, and boasts high accuracy with over-check rate